Vendor Profile
MIDORIYA
| Address | KDX edobashi Building 8F Nihonbashi Honcho 1-7-2 Chuo-ku Tokyo, JAPAN ZIP:103-0023 |
|---|---|
| Representative Name | MAKOTO KUROHA |
| Annual Revenue | closed |
| No. of Employees | closed |
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SD item code:9281613
| Detail | Price & Quantity | ||
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 Original text before translation
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(ITS-PP-2015-7003SCM-NEX)
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(ITS-PP-2015-7003SCM-NEX)
Wholesale Price: Members Only
1 pc /set
Sold Out
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| Shipping Date |
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About 1 month
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| Dimensions |
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| Specifications |
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Country of manufacture: United States
Material / component: nothing special (with neg. verb)
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Description
| Maintenance and cleaning of probe cards (wafer inspection jigs) Optimized support for various probe types → Cantilever probe card maintenance* cleaning → Maintenance and cleaning of vertical probe cards → Cobra type, backlink beam type, pogo type → Point tip, flat tip, crown tip → MEMS probe card maintenance* cleaning → Micro Cantilever Type, Vertical Type Probe card cleaning for -50 to 200°C No.1 share in probe card cleaning for memory test No.1 share in probe card cleaning for ultra-high temperature Support for probe polishing table (Cleaning unit, WAAP) dimensions Probe Polish 70-03 300mm x 775um wafer No Edge Exclusion Probe Polish 150-03 150mm x 150mm for TSK UF3000 series |
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| Shipping Method | Estimated Arrival |
|---|---|
| Sea Mail | From Jun.29th 2026 to Aug.31st 2026 |
| Air Mail | From Jun.11th 2026 to Jun.15th 2026 |
| EMS | From Jun.10th 2026 to Jun.15th 2026 |
| Pantos Express | From Jun.12th 2026 to Jun.17th 2026 |
| DHL | From Jun.10th 2026 to Jun.12th 2026 |
| UPS | From Jun.10th 2026 to Jun.12th 2026 |
| FedEx | From Jun.10th 2026 to Jun.12th 2026 |
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Some trading conditions may be applicable only in Japan. |
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auto partsOther items from this category:
Optimized support for various probe types
→ Cantilever probe card maintenance* cleaning
→ Maintenance and cleaning of vertical probe cards
→ Cobra type, backlink beam type, pogo type
→ Point tip, flat tip, crown tip
→ MEMS probe card maintenance* cleaning
→ Micro Cantilever Type, Vertical Type
Probe card cleaning for -50 to 200°C
No.1 share in probe card cleaning for memory test
No.1 share in probe card cleaning for ultra-high temperature
Support for probe polishing table (Cleaning unit, WAAP) dimensions
Probe Polish 70-03 300mm x 775um wafer No Edge Exclusion
Probe Polish 150-03 150mm x 150mm for TSK UF3000 series